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edition: 1st ed. Authors: S. Jayanthy, M.C. Bhuvaneswari serie: ISBN : 9789811324925 publisher: Springer Singapore publish year: 2019 pages: 161 language: English ebook format : PDF (It will be converted to PDF, EPUB OR AZW3 if requested by the user) file size: 3 MB
Front Matter ....Pages i-xi
Introduction (S. Jayanthy, M. C. Bhuvaneswari)....Pages 1-14
Delay Fault Testing of VLSI Circuits (S. Jayanthy, M. C. Bhuvaneswari)....Pages 15-35
Test Generation Algorithms for Crosstalk Faults (S. Jayanthy, M. C. Bhuvaneswari)....Pages 37-55
An Automatic Test Generation Method for Crosstalk Delay Faults Using Modified FAN Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 57-77
ATPG for Crosstalk Delay Faults using Single-Objective Genetic Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 79-97
ATPG for Crosstalk Delay Faults Using Particle Swarm Optimization Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 99-108
ATPG for Crosstalk Delay Faults Using Multi-objective Genetic Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 109-123
Simulation of Asynchronous Sequential Circuits Using Fuzzy Delay Model for Crosstalk Delay Faults (S. Jayanthy, M. C. Bhuvaneswari)....Pages 125-139
Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits (S. Jayanthy, M. C. Bhuvaneswari)....Pages 141-150
Summary and Suggestions for Future Research (S. Jayanthy, M. C. Bhuvaneswari)....Pages 151-156
